Dual-Basis Design

  • Author Warfield, John N.

Discussion of the concept of due process in design as a way to identify and monitor responsible management practices, which would lower the rate of catastrophic design failures. Warfield calls for the creation of a basic design science, with standards and practices for large-scale system designers that could become well-defined and legally enforceable over time. Prepared for ASME Conference, Boston, MA, 17-20 August 1987. See, "Dual-Basis Design (Transparencies)" for the transparencies developed to accompany talk. Later printed in Polish. See, "Dwie Podstawy Projektowania (Dual-Basis Design)."


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